Thin-Film Coating Calculator
Determine the reflectance of a single dielectric thin film on a substrate at normal incidence. Analyzes quarter-wave and half-wave conditions for anti-reflection and high-reflection coating design.
Inputs
e.g., MgF₂=1.38, SiO₂=1.46, TiO₂=2.4
Results
Reflectance
1.26%
QW Reflectance
1.26%
Ideal AR Index
1.233
Thin-Film Coating Results
| Parameter | Value |
|---|---|
| Reflectance R | 1.2602% |
| Optical Thickness n×d | 138.00 nm |
| Phase δ | 90.33° (0.5018π) |
| Quarter-Wave R | 1.2601% |
| Half-Wave R (uncoated) | 4.2580% |
| Ideal AR Film Index | √(n_air × n_s) = 1.2329 |
| Quarter-Wave Thickness | 99.64 nm |
| Film Index n_f | 1.38 |
| Substrate Index n_s | 1.52 |
Frequently Asked Questions
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